Dr. Gene Meieran, Intel Senior Fellow, recently retired as a member of the Future Technology Division of Intel Research. He had been working on knowledge sharing and collaboration applications to help individuals and teams make better, faster and more cost-effective decisions. He joined Intel in 1973 as creator of Package Development, now Assembly-Test Development. In 1977, he joined the Quality and Reliability Department, responsible for all Intel incoming materials quality, the new Materials Analysis Laboratories and key elements of the wafer fab, assembly SPC and reliability functions. In 1977, he introduced statistical process control methodology to all Intel manufacturing sites. In 1985, he was appointed Intel’s 2nd Fellow, and in 2004, Senior Intel Fellow. Dr. Meieran has taught technical courses on x-ray diffraction at Stanford and UC Berkeley and has given seminars and invited talks to many universities throughout the world. He has a Master’s degree and a Doctor’s degree in Material Science from MIT (1961 and 1963) and a B.S degree in Metallurgy from Purdue University (1959).